Učni načrt predmeta

Predmet:

Analizne metode s hitrimi ioni

Course:

Ion Beam Analysis

Študijski program in stopnja / Study programme and level	Študijska smer / Study field	Letnik / Academic year	Semester / Semester
Senzorske tehnologije, 3. stopnja	/	1	1
Sensor technologies, 3rd cycle	/	1	1

Vrsta predmeta / Course type

Izbirni / Elective

Univerzitetna koda predmeta / University course code:

ST3-537

Predavanja Lectures	Seminar Seminar	Vaje Tutorial	Klinične vaje work	Druge oblike študija	Samost. delo Individ. work	ECTS
15	15			15	105	5

*Navedena porazdelitev ur velja, če je vpisanih vsaj 15 študentov. Drugače se obseg izvedbe kontaktnih ur sorazmerno zmanjša in prenese v samostojno delo. / This distribution of hours is valid if at least 15 students are enrolled. Otherwise the contact hours are linearly reduced and transfered to individual work.

Nosilec predmeta / Course leader:

prof. dr. Primož Pelicon

Sodelavci / Lecturers:

Jeziki / Languages:

Predavanja / Lectures:

Slovenski ali angleški / Slovene or English

Vaje / Tutorial:

Pogoji za vključitev v delo oz. za opravljanje študijskih obveznosti:

Prerequisites:

Zaključen študij druge stopnje ustrezne (naravoslovne ali tehniške) smeri ali zaključen študij drugih smeri z dokazanim poznavanjem osnov področja predmeta (pisna dokazila, pogovor).

Completed second-cycle studies in natural sciences or engineering or completed second-cycle studies in other fields with proven knowledge of fundamentals in the field of this course (certificates, interview).

Vsebina:

Content (Syllabus outline):

Interakcija hitrih ionov s snovjo:
- Ustavljanje
- Sipanje
- Ionizacija
- Vzbuditev jeder

Spektroskopije s sipanjem hitrih ionov:
- Spektroskopija z Rutherfordovim povratnim sipanjem (RBS)
- Spektroskopija z elastičnim povratnim sipanjem ionov (EBS)
- Spektroskopija elastično odrinjenih jeder (ERDA)

Spektroskopije z vzbuditvijo fotonske emisije:
- Spektroskopija ionsko vzbujenih rentgenskih žarkov (PIXE)
- Spektroskopija ionsko vzbujenih žarkov gama (PIGE)

Spektroskopije z vzbuditvijo jedrskih reakcij:
- Spektroskopija z reakcijami (3He,p)
- Detekcija vodika z ionskim žarkom 15N
- Spektroskopija z reakcijami (p, α)

Uporaba fokusiranih visokoenergijskih ionskih žarkov:
- Oblikovanje visokoenergijskih fokusiranih žarkov
- Sistemi zajema za oblikovanje elementnega zemljevida
- Metoda presevne ionske mikroskopije (STIM)
- Mikroobdelava s fokusiranim ionskim žarkom (PBW)

Napredne metode IBA:
- MeV SIMS
- Tomografija PIXE/STIM
- Konfokalna metoda PIXE
- Obsevanje s posameznimi ioni
- Analiza v zraku
- Izvedba metod IBA s pozicijsko občutljivimi detektorji
- Izvedba metod IBA z meritvijo časa preleta

Interaction of fast ions with matter:
- Stopping
- Scattering
- Ionisation
- Nuclear excitation

Spectroscopic methods with ion scattering:
- Rutherford Backscattering Spectroscopy (RBS)
- Elastic Backscettering Spectroscopy (EBS)
- Elastic Recoil Detection Spectroscopy (ERDA)

Spectroscopic methods with photon emmision:
- Particle-Induced X-ray Spectroscopy (PIXE)
- Particle-Induced Gamma-Spectroscopy (PIGE)

Nuclear Reaction Analysis (NRA):
- Spectroscopy based on (3He,p) reaction
- Hydrogen detection with 15N beam
- Spectroscopy based on (p, α) reaction

Application of focused high-energy ion beams:
- Shaping of focused high-energy ion beams
- Acquisition principles of elemental mapping
- Scanning Transmission Ion Microscopy
- Proton Beam Writing (PBW)

Advanced methods of Ion Beam Analysis (IBA):
- MeV SIMS
- PIXE/STIM tomography
- Confocal PIXE
- Single ion irradiation
- In-air analysis
- IBA methods with position-sensitive detectors
- IBA methods based on Time-Of-Flight principle

Temeljna literatura in viri / Readings:

Izbrani članki iz znanstvene periodike / Selected scientific journal publications:
- Nuclear Instruments and Methods in Phys. Res. B,
- Journal of Analytical Atomic Spectroscopy,
- Journal of applied Physics/Applied Physics Letters.

Knjiga / Book:
- Handbook of Modern Ion Beam Materials Analysis, Y. Wang, M. Nastasi, Cambridge University Press,
2010.

Cilji in kompetence:

Objectives and competences:

Cilji:
- slušatelj pozna zmogljivosti in specifičnosti naprednih analiznih metod z visokoenergijskimi ionskimi žarki,
- slušatelj razume strukturo rentgenskega emisijskega spektra PIXE,
- slušatelj razume fizikalne procese in iz njih sklepa na obliko spektra povratno sipanih ionov,
- slušatelj poišče optimalno energijo in vrsto žarka za rešitev izbranega analitskega problema.

Kompetence:
- slušatelj zna po opravljenem predmetu poiskati analizno metodo s hitrimi ioni za rešitev raziskovalnega problema na njemu bližnjem raziskovalnem področju,
- slušatelj obvlada osnovno orodje za analizo rentgenskega emisijskega spektra PIXE za določitev koncentracije elementov v sledeh v vzorcu,
- slušatelj obvlada osnovno orodje za simulacijo in analizo spektra povratno sipanih ionov in je iz oblike spektra sposoben določiti stehiometrijo in elementni globinski koncentracijski profil tanke plasti.

Objectives:
- student learns the capabilities and specifics of modern Ion Beam Analytical methods,
- student understands the structure of X-ray emission spectrum PIXE,
- student understands the physical processes and the corresponding shape of Rutherford backscattering spectrum,
- student determines the optimal ion beam type and energy for selected analytical problem.

Competences:
- student is capable to identify optimal IBA method for problem solving at his field of research,
- student able to use basic analytical software for the analysis of PIXE spectra and determination of trace element concentrations,
- student is able to use software for simulation and analysis of the backscattering spectra and is able to determine thin film stechiometry and elemental depth concentration profiles.

Predvideni študijski rezultati:

Intendeded learning outcomes:

Znanje in razumevanje:
- poznavanje sodobnih analiznih metod s hitrimi ioni in njihovauporaba,
- sposobnost uporabe analiznih metod s hitrimi ioni na različnih raziskovalnih področjih, s poudarkom na slušateljevem raziskovalnem področju,
- praktično razumevanje izmerjenih spektrov in obvladovanje osnovnih orodij za njihovo analizo,
- vključevanje novo pridobljenega znanja v izvedbo slušateljevega doktorskega dela.

Knowledge and understanding:
- knowledge and understanding of IBA methods and their applications,
- capability to apply IBA methods application in various research fields, with emphasis on the research field familiar to the student,
- practical understanding of acquired spectra and gaining capabilities to use the basic software for spectra analysis,
- inclusion of the acquired knowledge and skills into the dissertation research.

Metode poučevanja in učenja:

Learning and teaching methods:

Interaktivno delo s študentom.
Učenje prepoznavanja vzorcev znanja (knowledge pattern recognition) in reševanje realnih problemov (case-study).

Interactive work with a student.
Pattern recognition and case studies.

Načini ocenjevanja:

Delež v % / Weight in %

Assesment:

Seminar z opisom izbrane analizne metode in njenih aplikacij, po možnosti iz problematike, ki je najbližje kandidatovemu raziskovalnemu področju

30 %

Seminar describing particular application of Ion Beam Analytical method in a research field close to the candidate

Projekt kvantitativne analize spektra

20 %

Project of quantitative analysis of IBA spectrum

Ustno izpraševanje

50 %

Oral examination

Reference nosilca / Lecturer's references:

1.	JEROMEL, Luka, OGRINC POTOČNIK, Nina, SIKETIĆ, Zdravko, VAVPETIČ, Primož, RUPNIK, Zdravko, BUČAR, Klemen, JENČIČ, Boštjan, KELEMEN, Mitja, VENCELJ, Matjaž, VOGEL-MIKUŠ, Katarina, KOVAČ, Janez, HEEREN, Ron M. A., FLINDERS, Bryn, CUYPERS, Eva, BARBA, Žiga, PELICON, Primož. Molecular imaging of humain hair with MeV-SIMS : a case study of cocaine detection and distribution in the hair of a cocaine user. PloS one. 2022, vol. 17, no. 3, str. 0263338-1-026338-11. ISSN 1932-6203. DOI: 10.1371/journal.pone.0263338
2.	PONGRAC, Paula, KELEMEN, Mitja, VAVPETIČ, Primož, VOGEL-MIKUŠ, Katarina, REGVAR, Marjana, PELICON, Primož. Application of micro-PIXE (particle induced X-ray emission) to study buckwheat grain structure and composition. Fagopyrum. 2020, vol. 37, no. 1, str. 5-10. ISSN 2712-2859. DOI: 10.3986/fag0012
3.	JENČIČ, Boštjan, VAVPETIČ, Primož, KELEMEN, Mitja, PELICON, Primož. Secondary ion yield and fragmentation of biological molecules by employing 35Cl primary ions within the MeV energy domain. Journal of the American Society for Mass Spectrometry. [Print ed.]. 2020, vol. 31, iss. 1, str. 117-123, graf. prikazi. ISSN 1044-0305. DOI: 10.1021/jasms.9b00019
4.	CLOETE, Karen Jacqueline, ŠMIT, Žiga, MINNIS-NDIMBA, Roya, VAVPETIČ, Primož, DU PLESSIS, Anton, ROUX, Stephan G. le, PELICON, Primož. Physico-elemental analysis of roasted organic coffee beans from Ethiopia, Colombia, Honduras, and Mexico using X-ray micro-computed tomography and external beam particle induced X-ray emission. Food chemistry. X. 2019, vol. 2, str. 100032-1-100032-8. ISSN 2590-1575. DOI: 10.1016/j.fochx.2019.100032
5.	MALAY, Ali D., KELEMEN, Mitja, VAVPETIČ, Primož, PELICON, Primož, et al. An ultra-stable gold-coordinated protein cage displaying reversible assembly. Nature : the international weekly journal of science. [Print ed.]. 2019, vol. 569, str. 438–442, ilustr. ISSN 0028-0836. DOI: 10.1038/s41586-019-1185-4