Učni načrt predmeta

Predmet:

Rentgenska strukturna analiza

Course:

X-ray Structure Analysis

Študijski program in stopnja / Study programme and level	Študijska smer / Study field	Letnik / Academic year	Semester / Semester
Nanoznanosti in nanotehnologije, 3. stopnja, Ekotehnologije, 3. stopnja	/	1	1
Nanosciences and Nanotechnologies, 3rd cycle, Ecotechnologies, 3rd cycle	/	1	1

Vrsta predmeta / Course type

Izbirni / Elective

Univerzitetna koda predmeta / University course code:

NANO3-771

Predavanja Lectures	Seminar Seminar	Vaje Tutorial	Klinične vaje work	Druge oblike študija	Samost. delo Individ. work	ECTS
15	15			15	105	5

*Navedena porazdelitev ur velja, če je vpisanih vsaj 15 študentov. Drugače se obseg izvedbe kontaktnih ur sorazmerno zmanjša in prenese v samostojno delo. / This distribution of hours is valid if at least 15 students are enrolled. Otherwise the contact hours are linearly reduced and transfered to individual work.

Nosilec predmeta / Course leader:

doc. dr. Evgeny Goreshnik

Sodelavci / Lecturers:

Jeziki / Languages:

Predavanja / Lectures:

Slovenščina, angleščina / Slovene, English

Vaje / Tutorial:

Pogoji za vključitev v delo oz. za opravljanje študijskih obveznosti:

Prerequisits:

Vsebina:

Content (Syllabus outline):

Najbolj informativna metoda za določanje kristalnih struktur - rentgenska strukturna analiza, je na široko opisana v knjigah in na spletnih straneh. Na žalost pa so temeljna načela in teoretične osnove rentgenske difrakcije, rešitve in izboljševanje kristalnih struktur, kot tudi rezultati zmanjševanja neidealnosti kristalov, pogosto objavljeni ločeno od praktičnih nasvetov.

Predmet je namenjen:
- hitremu pregledu temeljnih načel difrakcijske analize atomske strukture kristaliničnih materialov,
- razlagi fizikalnih osnov interakcije kristalov z rentgenskimi žarki, elektroni in počasnimi nevtroni,
- razpravi o točkovnih in prostorskih skupinah ter metodah za določevanje simetrije,
- analizi glavnih eksperimentalnih težav, s katerimi se srečujemo pri reševanju kristalnih struktur.

Večji del bo namenjen:
- reševanju in rafiniranju kristalnih struktur različnih spojin z uporabo najpogostejših za te namene uporabnih programskih orodij, (Superflip, Shelxt, SIR, Shelxs in Shelxl) ki se izvajajo v okviru programskega paketa Olex2,
- ocenjevanju in interpretacije rezultatov,
- prepoznavanju različnih težav in načinov reševanja le-teh,
- pripravi rezultatov za objavo,
- preverjanju kakovosti materialov s pomočjo internetnih orodij.

The most informative method to study crystal structure – X-ray structure analysis is described widely in both printed books and internet – resources. Unfortunately, fundamental principles and theoretical base of X-ray diffraction, crystal structures solution and refinement, reducing results of crystals imperfectness are published frequently separately from the advices on practical technique.

The course is designed to:
- quickly touch the basic principles of the diffraction analysis of the atomic structure of crystalline materials,
- explain the physical basis of interaction of X-rays and electrons and slow neutrons with matter,
- discuss point and space groups, methods of
determining the characteristics of symmetry,
- analyze the main experimental problems in diffraction studies of crystal structure.

The major part is devoted to:
- solving and refining crystal structures of various compounds using the most common for these purposes Superflip, Shelxt, SIR, Shelxs and Shelxl software implemented in a program package Olex2,
- structures analyses and interpretation,
- finding indications of different troubles and the ways how to resolve it,
- preparing results for publication,
- checking the quality of prepared materials using internet-services.

Temeljna literatura in viri / Readings:

Cilji in kompetence:

Objectives and competences:

Predvideni študijski rezultati:

Intendeded learning outcomes:

Metode poučevanja in učenja:

Learning and teaching methods:

Načini ocenjevanja:

Delež v % / Weight in %

Assesment:

Reševanje kristalnih struktur, pri katerih nastopajo določene težave, z uporabo pripravljenih podatkov

100 %

Solving the crystal structure with definite troubles using the supplied data

Reference nosilca / Lecturer's references:

1.	Igor M. Shlyapnikov, Evgeny A. Goreshnik and Zoran Mazej. The cubic [Ti8F36]4– anion found in the crystal structures of K4Ti8F36·8HF and Rb4Ti8F36·6HF. Chem. Commun., 2013, 49, 2703-2705.
2.	Kristian Radan, Evgeny Goreshnik, Boris Žemva. Xenon(II) Polyfluoridotitanates(IV): Synthesis and Structural Characterization of [Xe2F3]+ and [XeF]+ Salts. Angew. Chem. Int. Ed. 2014, 53, 50, 13715– 13719.
3.	Zoran Mazej, Tomasz Michałowski, Evgeny A. Goreshnik, Zvonko Jagličić, Iztok Arčon, Jadwiga Szydłowska, and Wojciech Grochala. The first example of a mixed valence ternary compound of silver with random distribution of Ag(I) and Ag(II) cations. Dalton Trans., 2015, 44, 10957–10968.
4.	E.A. Goreshnik, G.Veryasov, D. Morozov, Yu. Slyvka, B. Ardan and M.G. Mys'kiv. Solvated copper(I) hexafluorosilicate -complexes based on [Cu2(amtd)2]2+ (amtd = 2-allylamino-5-methyl-1,3,4- thiadiazole) dimer. J. Organometallic Chem., 2016, 810, 1-11.
5.	Zoran Mazej, Evgeny Goreshnik. "Influence of the Increasing Size of the M2+ Cation on the Crystal Structures of XeF5M(SbF6)3 (M = Ni, Mg, Cu, Zn, Co, Mn, Pd), and the Crystal Structure of (XeF5)3[Hg(HF)]2(SbF6)7". Eur. J. Inorg. Chem., 2016, 20, 3356-3364.