DEFENCE OF THE DOCTORAL DISSERTATION BY JERNEJ EKAR
Optimization of ToF-SIMS depth profiling in low pressure H2, C2H2, CO and O2 atmosphere
Optimization of ToF-SIMS depth profiling in low pressure H2, C2H2, CO and O2 atmosphere
IPS invites you to the Defence of the Doctoral Dissertation by Jernej Ekar titled: Optimization of ToF-SIMS depth profiling in low pressure H2, C2H2, CO and O2 atmosphere. The defence will take place on Monday, 22 April 2024, at 11:00 a.m. at the IPS Lecture Room, Jamova 39, 1000 Ljubljana. You can also join the defence via the following link: https://us02web.zoom.us/j/81956454297?pwd=MlA0OUNyejJJNkFRbEphS3BrMndRdz09 (Meeting ID: 819 5645 4297, Passcode: 020274).
Short summary (in Slovenian):
Masna spektrometrija sekundarnih ionov (SIMS) je analitska metoda za preiskave kemijske sestave površin. Z njo analiziramo samo zgornjih nekaj atomskih oz. molekulskih plasti, ob uporabi posebnih nastavitev pa lahko spremljamo tudi globinsko sestavo vzorca. V okviru doktorske naloge smo optimizirali tehniko SIMS tako, da smo v analitsko komoro, v kateri je običajno ultra visoki vakuum, vpuščali različne reaktivne pline. Najbolje se je odrezal H2, ki je izboljšal kvantitativnosti metode in optimiziral možnosti spremljanja globinske sestave.
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