COURSES

Characterisation of Structure

5

ECTS Credits

Lecturers
  • prof. dr. Iztok Arčon
Programmes
  • None

Goals

In this course, the students learn basics of modern X-ray absorption spectroscopic (XAS) and microscopic methods for the characterization of the atomic and molecular structure of materials with synchrotron radiation. General Competences: - The student will master research methods, procedures and processes - The student will develop critical thinking - The student will develop communications skills to present research achievement in the international environment - Work in team (in international environment) Course Specific Competences: Students gain basic applied knowledge about up-to-date X-ray absorption spectroscopic and microscopic methods with synchrotron radiation for the characterization of the atomic and molecular structure of (nano)materials.They gain basic knowledge to plan and use x-ray absorption and fluorescence methods ((mikro) XANES, EXAFS, (mikro)XRF) with synchrotron radiation for material characterization.

Curriculum

Students are acquainted in detail with individual spectroscopic methods (e.g. X-ray absorption and emission spectroscopy EXAFS, (micro)XANES, microXRF), which are most frequently used in the characterization of materials (in crystalline, nanostructured or amorphous state, or liquids and sol-gels), as for example catalysts or Li-Ion batteries. The course presents the properties of the most important, particularly synchrotron radiation sources and experimental stations used by individual spectroscopic methods. Emphasis is placed on the applicability of individual spectroscopic methods and their complementarities and the use of these spectroscopies in-situ and in-operando. Students use real cases to learn basics of the analysis of specific material structural properties.

Obligations

Completed second cycle education or university education from natural sciences or technology.

Examination

Literature and references

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